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The doctoral program GRK 1896 “In situ Microscopy with Electrons, X-rays and Scanning Probes” combines, for the first time, three pillars of nanocharacterization into a structured research training group. The main objective of this program is to provide the next generation of scientists and engineers with comprehensive, method-spanning and interdisciplinary training in the application of cutting-edge nanocharacterization tools to materials and device development. Our PhD candidates are well-positioned in a network of international collaborations and highly trained in multiple, complementary techniques, providing them with an essential foundation for a successful career in the field of advanced materials and devices development.
The 4th CENEM Summer School for X-ray Scattering will be held at the Institute for Crystallography and Structural Physics (ICSP) from 16th to 19th of July 2018. The school will provide a perfect opportunity to get a detailed insight into theory and practice of several modern scattering methods as X-... Continue
This year’s GRK school took place from the 26th of February to the 1st of March in Großarl (Austria). It featured various new aspects as compared to former schools: Besides being a non-PI school, it took place, for the first time, in winter. In addition, a new format of talks, namely methodological ... Continue
Due to their special properties, such as their deformation behavior, nanomaterials play a key role in modern materials research. In order to better understand this, the young scientists of the doctoral program GRK 1896 "In situ microscopy with electrons, X-rays and scanning probes" around EAM member... Continue
The inauguration of our new x-ray microscope will take place on the 10th of November starting at 10:00. The festive activities will include a presentation by renowned tomography expert Prof. Philip Withers as well as a labtour to the new instrument For more information on the program please look at ... Continue
Erlangen 27.07.2017 – Zeiss Xradia Ultra 810 (nano-CT), a high resolution lab source X-ray microscope, has been installed in Erlangen and successfully passed the acceptance test. The instrument can provide a resolution of 50 nm thanks to its advanced modern X-ray optics. Being a dedicated tomography... Continue
The application for funding of the NanoMill® TEM specimen preparation system has been granted recently by DFG.
Fischione’s Model 1040 NanoMill® TEM specimen preparation system is an excellent tool for creating high-quality thin specimens needed for advanced transmission electron microscopy imagin... Continue
The 3rd CENEM Summer School for X-ray Scattering will be held at the Institute for Crystallography and Structural Physics (ICSP) from 24th to 27th of July 2017. The school will provide a perfect opportunity to get a detailed insight into theory and practice of several modern scattering methods as X-... Continue
